#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203755
Mfr serial number	STN11548-03755

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203755

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.12229
I_LEAK350V (microA)	0.1889
Substr Origin	108
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	60
R Bias Upper (MOhm)	1.56
R Bias Lower (MOhm)	1.37

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	36.42
20	53.51
30	61.5
40	67.57
50	72.94
60	78.52
70	84.38
80	90.06
90	95.4
100	100.42
110	105.16
120	109.51
130	114
140	118.21
150	122.29
160	126.3
170	130.19
180	134
190	137.74
200	141.39
210	144.93
220	148.33
230	151.74
240	155.14
250	158.48
260	161.76
270	164.99
280	168.16
290	171.25
300	174.38
310	177.43
320	180.39
330	183.2
340	186.1
350	188.9
	
#CV	
10	
15	O.L.
20	O.L.
25	2501.64
30	2159.2
35	1918.68
40	1741.74
45	1608.15
50	1515.49
55	1464.33
60	1442.46
65	1433.5
70	1429.09
75	1426.33
80	1424.31
85	1422.65
90	1421.32
95	1420.13
100	1419.08
105	1418.1
110	1417.24
115	1416.25
120	1415.77

#End of manufacturer data file