#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203760
Mfr serial number	STN11548-03760

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203760

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.13304
I_LEAK350V (microA)	0.2094
Substr Origin	108
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	65
R Bias Upper (MOhm)	1.56
R Bias Lower (MOhm)	1.37

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	38.36
20	54.15
30	62.57
40	69.51
50	76.22
60	82.91
70	89.8
80	96.37
90	102.43
100	108.14
110	113.54
120	118.68
130	123.65
140	128.4
150	133.04
160	137.62
170	141.83
180	146.38
190	150.62
200	154.79
210	158.88
220	162.87
230	166.69
240	170.52
250	174.33
260	178.07
270	181.8
280	185.3
290	188.9
300	192.3
310	195.9
320	199.3
330	202.7
340	206.1
350	209.4
	
#CV	
10	
15	O.L.
20	O.L.
25	2615.85
30	2254.97
35	2002.91
40	1815.01
45	1671.12
50	1561.57
55	1487.97
60	1449.71
65	1433.38
70	1426.54
75	1422.96
80	1420.58
85	1418.77
90	1417.28
95	1416.01
100	1414.94
105	1413.96
110	1413.02
115	1412.34
120	1411.71

#End of manufacturer data file