#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203764
Mfr serial number	STN11548-03764

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203764

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.13938
I_LEAK350V (microA)	0.2249
Substr Origin	108
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	293
Vdep (V)	60
R Bias Upper (MOhm)	1.56
R Bias Lower (MOhm)	1.37

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	38.66
20	56.64
30	65.45
40	72.2
50	78.47
60	85.27
70	92.56
80	99.49
90	106.02
100	112.11
110	117.98
120	123.56
130	128.99
140	134.22
150	139.38
160	144.4
170	149.31
180	154.15
190	158.92
200	163.57
210	168.16
220	172.58
230	176.98
240	181.2
250	185.4
260	189.5
270	193.7
280	197.7
290	201.6
300	205.6
310	209.5
320	213.3
330	217.3
340	221.1
350	224.9
	
#CV	
10	
15	O.L.
20	2973.39
25	2442.68
30	2107.57
35	1871.8
40	1699.93
45	1572.3
50	1489.55
55	1448.51
60	1432.35
65	1425.66
70	1421.9
75	1419.38
80	1417.44
85	1415.91
90	1414.54
95	1413.4
100	1412.4
105	1411.46
110	1410.66
115	1409.86
120	1409.04

#End of manufacturer data file