#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203765
Mfr serial number	STN11548-03765

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203765

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.13436
I_LEAK350V (microA)	0.2139
Substr Origin	108
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	293
Vdep (V)	55
R Bias Upper (MOhm)	1.56
R Bias Lower (MOhm)	1.37

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	37.31
20	55.4
30	63.95
40	70.55
50	76.78
60	83.22
70	89.78
80	96.35
90	102.61
100	108.48
110	114.06
120	119.4
130	124.31
140	129.5
150	134.36
160	139.1
170	143.73
180	148.28
190	152.73
200	157.11
210	161.33
220	165.47
230	169.54
240	173.58
250	177.55
260	181.3
270	185
280	188.8
290	192.5
300	196.2
310	199.8
320	203.4
330	206.9
340	210.4
350	213.9
	
#CV	
10	
15	O.L.
20	2963.96
25	2434.04
30	2099.35
35	1863.89
40	1692.6
45	1565.8
50	1485.16
55	1447.02
60	1432.53
65	1426.39
70	1422.86
75	1420.42
80	1418.49
85	1416.81
90	1415.46
95	1414.23
100	1413.14
105	1412.19
110	1411.31
115	1410.64
120	1409.9

#End of manufacturer data file