#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203766
Mfr serial number	STN11548-03766

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203766

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.13396
I_LEAK350V (microA)	0.2146
Substr Origin	108
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	294
Vdep (V)	60
R Bias Upper (MOhm)	1.56
R Bias Lower (MOhm)	1.37

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	37.86
20	54.87
30	63.27
40	69.69
50	75.56
60	82.26
70	89.33
80	95.95
90	102.15
100	107.98
110	113.57
120	118.73
130	124.08
140	129.06
150	133.96
160	138.74
170	143.43
180	148.03
190	152.55
200	156.99
210	161.36
220	165.55
230	169.64
240	173.71
250	177.74
260	181.5
270	185.4
280	189.2
290	193
300	196.7
310	200.4
320	204
330	207.6
340	211.2
350	214.6
	
#CV	
10	
15	O.L.
20	2998.3
25	2462.1
30	2123.45
35	1885.77
40	1711.83
45	1582.27
50	1495.67
55	1450.43
60	1432.07
65	1424.66
70	1420.75
75	1418.16
80	1416.22
85	1414.62
90	1413.28
95	1412.11
100	1411.12
105	1410.19
110	1409.31
115	1408.57
120	1407.94

#End of manufacturer data file