#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203767
Mfr serial number	STN11548-03767

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203767

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.13157
I_LEAK350V (microA)	0.2085
Substr Origin	108
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	293
Vdep (V)	60
R Bias Upper (MOhm)	1.56
R Bias Lower (MOhm)	1.37

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	362																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	37.7
20	54.4
30	62.83
40	69.31
50	75.38
60	81.78
70	88.39
80	94.9
90	100.95
100	106.63
110	112
120	117.16
130	122.1
140	126.91
150	131.57
160	135.92
170	140.64
180	145.06
190	149.35
200	153.59
210	157.75
220	161.75
230	165.68
240	169.53
250	173.37
260	177.17
270	180.8
280	184.3
290	187.9
300	191.5
310	195
320	198.4
330	201.8
340	205.2
350	208.5
	
#CV	
10	
15	O.L.
20	O.L.
25	2481.68
30	2140.66
35	1901.1
40	1725.55
45	1593.55
50	1503.69
55	1456.21
60	1437.08
65	1429.35
70	1425.36
75	1422.72
80	1420.76
85	1419.11
90	1417.73
95	1416.5
100	1415.42
105	1414.48
110	1413.64
115	1412.84
120	1412.14

#End of manufacturer data file