#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203770
Mfr serial number	STN11548-03770

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203770

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.12885
I_LEAK350V (microA)	0.2023
Substr Origin	108
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	293
Vdep (V)	60
R Bias Upper (MOhm)	1.56
R Bias Lower (MOhm)	1.37

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	36.56
20	53.53
30	61.71
40	68.08
50	74.07
60	80.43
70	87.02
80	93.37
90	99.28
100	104.78
110	109.98
120	114.96
130	119.73
140	124.34
150	128.85
160	133.04
170	137.52
180	141.7
190	145.77
200	149.79
210	153.74
220	157.57
230	161.25
240	164.86
250	168.42
260	171.96
270	175.44
280	178.86
290	182.3
300	185.8
310	189.5
320	192.9
330	196.1
340	199.2
350	202.3
	
#CV	
10	
15	O.L.
20	O.L.
25	2475.5
30	2136.68
35	1898.5
40	1724.26
45	1593.18
50	1504.07
55	1456.69
60	1437.42
65	1429.68
70	1425.61
75	1422.97
80	1420.9
85	1419.25
90	1417.91
95	1416.74
100	1415.73
105	1414.78
110	1413.99
115	1413.18
120	1412.46

#End of manufacturer data file