#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203772
Mfr serial number	STN11548-03772

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203772

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.12342
I_LEAK350V (microA)	0.1914
Substr Origin	108
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	293
Vdep (V)	60
R Bias Upper (MOhm)	1.56
R Bias Lower (MOhm)	1.37

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	37.16
20	52.09
30	59.98
40	66.23
50	71.93
60	78.1
70	84.47
80	90.47
90	95.99
100	101.13
110	106
120	110.65
130	115.1
140	119.41
150	123.42
160	127.69
170	131.69
180	135.62
190	139.43
200	143.2
210	146.91
220	150.45
230	153.93
240	157.36
250	160.71
260	164.03
270	167.27
280	170.45
290	173.63
300	176.71
310	179.76
320	182.6
330	185.6
340	188.5
350	191.4
	
#CV	
10	
15	O.L.
20	O.L.
25	2480.78
30	2140.37
35	1901.09
40	1726.31
45	1595.08
50	1505.66
55	1457.56
60	1437.72
65	1429.82
70	1425.73
75	1423.05
80	1421.07
85	1419.54
90	1418.2
95	1417
100	1415.98
105	1415.02
110	1414.11
115	1413.31
120	1412.54

#End of manufacturer data file