#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203774
Mfr serial number	STN11548-03774

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203774

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.11858
I_LEAK350V (microA)	0.1844
Substr Origin	108
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	294
Vdep (V)	55
R Bias Upper (MOhm)	1.56
R Bias Lower (MOhm)	1.37

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	35.07
20	50.32
30	57.89
40	63.58
50	69.03
60	74.78
70	80.53
80	86.2
90	91.59
100	96.63
110	101.42
120	105.81
130	110.32
140	114.51
150	118.58
160	122.56
170	126.41
180	130.18
190	133.86
200	137.48
210	141.02
220	144.48
230	147.87
240	151.22
250	154.5
260	157.72
270	160.89
280	164.01
290	167.06
300	170.1
310	173.04
320	175.96
330	178.92
340	181.6
350	184.4
	
#CV	
10	
15	O.L.
20	2896.71
25	2381.85
30	2056.37
35	1827.01
40	1661.2
45	1541.24
50	1470.32
55	1439.65
60	1428.47
65	1423.22
70	1420.03
75	1417.75
80	1415.95
85	1414.48
90	1413.23
95	1412.08
100	1411.14
105	1410.25
110	1409.46
115	1408.7
120	1407.94

#End of manufacturer data file