#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203854
Mfr serial number	STN11622-03854

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	23/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203854

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.15033
I_LEAK350V (microA)	0.2442
Substr Origin	110
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	286
Vdep (V)	65
R Bias Upper (MOhm)	1.55
R Bias Lower (MOhm)	1.39

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	50.08
20	70.29
30	80.31
40	87.58
50	94.79
60	100.84
70	107.31
80	113.48
90	119.35
100	124.91
110	130.28
120	135.47
130	140.55
140	145.59
150	150.33
160	155.28
170	160.01
180	164.58
190	169.17
200	173.7
210	178.18
220	182.7
230	187.2
240	191.69
250	196.2
260	200.9
270	205.3
280	209.7
290	214.2
300	218.3
310	222.7
320	226.8
330	231.2
340	236.7
350	244.2
	
#CV	
10	
15	O.L.
20	O.L.
25	2665.46
30	2299.51
35	2043.15
40	1848.92
45	1700.14
50	1585.21
55	1502.17
60	1455.24
65	1434.61
70	1426.42
75	1422.63
80	1420.24
85	1418.51
90	1417.18
95	1416.02
100	1415.04
105	1414.2
110	1413.59
115	1412.99
120	1412.38

#End of manufacturer data file