#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203859
Mfr serial number	STN11622-03859

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	23/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203859

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.15085
I_LEAK350V (microA)	0.238
Substr Origin	110
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	286
Vdep (V)	65
R Bias Upper (MOhm)	1.55
R Bias Lower (MOhm)	1.39

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	50.75
20	71.09
30	81.33
40	88.78
50	95.91
60	101.35
70	107.88
80	113.94
90	119.73
100	125.26
110	130.47
120	135.81
130	140.95
140	145.97
150	150.85
160	156.01
170	160.81
180	165.74
190	170.62
200	175.48
210	180.27
220	185.2
230	190
240	194.9
250	199.62
260	204.2
270	209
280	213.4
290	217.4
300	221.1
310	224.9
320	228.4
330	231.8
340	234.9
350	238
	
#CV	
10	
15	O.L.
20	O.L.
25	2668.73
30	2302.42
35	2046.26
40	1852.54
45	1703.87
50	1588.82
55	1505.6
60	1458.18
65	1437.13
70	1428.7
75	1424.77
80	1422.38
85	1420.62
90	1419.17
95	1418.08
100	1417.13
105	1416.28
110	1415.62
115	1415.09
120	1414.49

#End of manufacturer data file