#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203866
Mfr serial number	STN11622-03866

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	23/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203866

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.14437
I_LEAK350V (microA)	0.2292
Substr Origin	119
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	287
Vdep (V)	65
R Bias Upper (MOhm)	1.55
R Bias Lower (MOhm)	1.39

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	46.99
20	65.95
30	76.48
40	82.01
50	88.6
60	95.27
70	101.64
80	107.69
90	113.42
100	118.97
110	124.26
120	129.41
130	134.34
140	139.48
150	144.37
160	149.22
170	153.89
180	158.56
190	163.17
200	167.73
210	172.32
220	176.84
230	181.3
240	185.6
250	190.15
260	194.7
270	199.1
280	203.3
290	207.6
300	211.9
310	215.9
320	219.5
330	222.9
340	225.9
350	229.2
	
#CV	
10	
15	O.L.
20	O.L.
25	2601.97
30	2244.11
35	1993.14
40	1803.41
45	1658.72
50	1549.38
55	1475.77
60	1438.7
65	1423.9
70	1417.88
75	1414.82
80	1412.75
85	1411.2
90	1409.9
95	1408.89
100	1407.92
105	1407.15
110	1406.51
115	1405.93
120	1405.34

#End of manufacturer data file