#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203867
Mfr serial number	STN11622-03867

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	23/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203867

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.15234
I_LEAK350V (microA)	0.2427
Substr Origin	119
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	286
Vdep (V)	65
R Bias Upper (MOhm)	1.55
R Bias Lower (MOhm)	1.39

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	267																																							
Pinhole	269																																							
Pinhole	280																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA	
DATA	
#IV	
10	48.67
20	68.61
30	78.29
40	85.51
50	92.52
60	99.53
70	106.31
80	112.83
90	118.73
100	124.69
110	130.44
120	136.04
130	141.6
140	146.98
150	152.34
160	157.67
170	162.81
180	167.7
190	173.26
200	178.41
210	183.7
220	188.8
230	193.98
240	198.9
250	203.8
260	209.1
270	213.7
280	217.9
290	222
300	226
310	229.6
320	233.1
330	236.5
340	239.8
350	242.7
	
#CV	
10	
15	O.L.
20	O.L.
25	2603.15
30	2245.08
35	1994.17
40	1804.68
45	1660.3
50	1551.18
55	1477.86
60	1440.93
65	1425.69
70	1419.38
75	1416.18
80	1414.07
85	1412.57
90	1411.28
95	1410.23
100	1409.28
105	1408.48
110	1407.88
115	1407.21
120	1406.75

#End of manufacturer data file