#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203868
Mfr serial number	STN11622-03868

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	23/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203868

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.14954
I_LEAK350V (microA)	0.2374
Substr Origin	119
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	65
R Bias Upper (MOhm)	1.55
R Bias Lower (MOhm)	1.39

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	56																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	47.94
20	67.6
30	77.21
40	84.41
50	91.18
60	98.24
70	104.83
80	111.14
90	117.08
100	122.89
110	128.4
120	133.76
130	138.92
140	144.35
150	149.54
160	154.53
170	159.37
180	164.31
190	169.2
200	174.05
210	178.83
220	183.5
230	188.4
240	193.1
250	197.83
260	202.5
270	206.8
280	211.1
290	215.5
300	219.6
310	223.5
320	227.4
330	230.9
340	234.1
350	237.4
	
#CV	
10	
15	O.L.
20	O.L.
25	2587.48
30	2231.65
35	1981.82
40	1793.47
45	1649.84
50	1541.33
55	1468.78
60	1432.65
65	1418.01
70	1412
75	1408.91
80	1406.88
85	1405.35
90	1404.08
95	1403.12
100	1402.16
105	1401.36
110	1400.72
115	1400.11
120	1399.61

#End of manufacturer data file