#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203869
Mfr serial number	STN11622-03869

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	23/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203869

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.14683
I_LEAK350V (microA)	0.2338
Substr Origin	119
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	287
Vdep (V)	65
R Bias Upper (MOhm)	1.55
R Bias Lower (MOhm)	1.39

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	46.91
20	66.4
30	75.87
40	82.94
50	89.86
60	96.78
70	103.33
80	109.53
90	115.42
100	121.05
110	126.45
120	131.68
130	136.84
140	141.87
150	146.83
160	151.7
170	156.46
180	160.89
190	165.88
200	170.53
210	175.11
220	179.67
230	184.4
240	188.8
250	193.3
260	197.7
270	202.1
280	206.5
290	210.6
300	215
310	219.2
320	223.2
330	226.9
340	230.4
350	233.8
	
#CV	
10	
15	O.L.
20	O.L.
25	2610.46
30	2250.9
35	1998.98
40	1808.33
45	1663
50	1552.17
55	1475.69
60	1436.03
65	1419.86
70	1413.37
75	1410.14
80	1408.03
85	1406.44
90	1405.16
95	1404.11
100	1403.2
105	1402.42
110	1401.89
115	1401.22
120	1400.6

#End of manufacturer data file