#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203870
Mfr serial number	STN11622-03870

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	23/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203870

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.1782
I_LEAK350V (microA)	0.2715
Substr Origin	119
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	65
R Bias Upper (MOhm)	1.55
R Bias Lower (MOhm)	1.39

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	56.64
20	81.62
30	94.47
40	105.14
50	112.24
60	120.65
70	129.08
80	135.76
90	141.85
100	147.49
110	154.23
120	160.8
130	166.93
140	172.9
150	178.2
160	184.4
170	189.8
180	194.8
190	201.5
200	206.3
210	210.2
220	216
230	221.3
240	226
250	231.6
260	237.6
270	242.5
280	247.1
290	250.7
300	255.3
310	259.1
320	262.6
330	265.8
340	269.2
350	271.5
	
#CV	
10	
15	O.L.
20	O.L.
25	2595.44
30	2238.08
35	1988.26
40	1799.37
45	1657.95
50	1548.55
55	1474.96
60	1437.97
65	1423.27
70	1417.3
75	1414.18
80	1412.09
85	1410.52
90	1409.26
95	1408.15
100	1407.18
105	1406.35
110	1405.73
115	1405.01
120	1404.49

#End of manufacturer data file