#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203877
Mfr serial number	STN11622-03877

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	23/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203877

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.17672
I_LEAK350V (microA)	0.2779
Substr Origin	119
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	65
R Bias Upper (MOhm)	1.55
R Bias Lower (MOhm)	1.39

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	57.06
20	80.72
30	92.63
40	101.29
50	109.4
60	117.64
70	125.23
80	132.38
90	139.22
100	145.79
110	152.14
120	158.37
130	164.55
140	170.64
150	176.72
160	182.9
170	188.8
180	194.8
190	200.8
200	206.8
210	213
220	219.2
230	224.5
240	230.4
250	236.1
260	241
270	246.6
280	251.5
290	256.5
300	260.1
310	264.5
320	268.6
330	271.9
340	275.1
350	277.9
	
#CV	
10	
15	O.L.
20	O.L.
25	2633.17
30	2271.46
35	2018.55
40	1825.78
45	1678.72
50	1566.03
55	1486.29
60	1442.11
65	1422.79
70	1414.99
75	1411.31
80	1408.95
85	1407.33
90	1406.07
95	1404.93
100	1404.09
105	1403.33
110	1402.7
115	1402.16
120	1401.67

#End of manufacturer data file