#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203879
Mfr serial number	STN11622-03879

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	23/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203879

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.14444
I_LEAK350V (microA)	0.2278
Substr Origin	119
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	286
Vdep (V)	60
R Bias Upper (MOhm)	1.55
R Bias Lower (MOhm)	1.39

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	46.82
20	65.99
30	75.41
40	83.14
50	89.02
60	95.5
70	101.96
80	108.07
90	113.82
100	119.32
110	124.57
120	129.69
130	134.71
140	139.42
150	144.44
160	149.2
170	153.78
180	158.41
190	162.96
200	167.47
210	171.53
220	176.15
230	180.51
240	184.9
250	189.3
260	193.57
270	197.9
280	202.2
290	206.2
300	210.6
310	214
320	217.9
330	221.2
340	224.4
350	227.8
	
#CV	
10	
15	O.L.
20	O.L.
25	2603.97
30	2245.81
35	1994.88
40	1805.41
45	1661.38
50	1552.41
55	1480.06
60	1444.15
65	1429.45
70	1423.32
75	1420.18
80	1418.2
85	1416.73
90	1415.48
95	1414.53
100	1413.46
105	1412.68
110	1412.01
115	1411.44
120	1410.94

#End of manufacturer data file