#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203880
Mfr serial number	STN11622-03880

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	23/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203880

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.1671
I_LEAK350V (microA)	0.2565
Substr Origin	119
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	287
Vdep (V)	60
R Bias Upper (MOhm)	1.55
R Bias Lower (MOhm)	1.39

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	41.04
20	75.47
30	86.03
40	93.59
50	100.71
60	108.72
70	116.35
80	123.5
90	130.23
100	136.76
110	142.98
120	149.05
130	155.08
140	161.13
150	167.1
160	173.13
170	179.11
180	185.3
190	191.6
200	198
210	204.8
220	211.2
230	216.6
240	221.9
250	226.7
260	230.7
270	234.6
280	239.5
290	243.4
300	246.5
310	249.2
320	251.5
330	253.4
340	255.1
350	256.5
	
#CV	
10	
15	O.L.
20	O.L.
25	2540.38
30	2192.53
35	1948
40	1763.38
45	1623.59
50	1522.15
55	1461.09
60	1434.42
65	1424.43
70	1419.97
75	1417.36
80	1415.65
85	1414.32
90	1413.29
95	1412.47
100	1411.76
105	1410.87
110	1410.3
115	1409.62
120	1408.83

#End of manufacturer data file