#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204044
Mfr serial number	STN11630-04044

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204044

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.13391
I_LEAK350V (microA)	0.2065
Substr Origin	114
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.35
R Bias Lower (MOhm)	1.12

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	41.15
20	58.53
30	67.81
40	74.4
50	80.09
60	86.35
70	93.09
80	99.23
90	104.91
100	110.24
110	115.34
120	120.29
130	124.92
140	129.41
150	133.91
160	138.2
170	142.35
180	146.52
190	150.56
200	154.47
210	158.39
220	162.19
230	165.91
240	169.54
250	173.2
260	176.75
270	180.24
280	183.7
290	187
300	190.3
310	193.6
320	197.1
330	200.2
340	203.4
350	206.5
	
#CV	
10	
15	O.L.
20	O.L.
25	2535.59
30	2188.68
35	1946.24
40	1764.21
45	1625.5
50	1524.29
55	1463.78
60	1436.43
65	1425.77
70	1421
75	1418.18
80	1416.18
85	1414.6
90	1413.31
95	1412.22
100	1411.27
105	1410.44
110	1409.76
115	1409.03
120	1408.35

#End of manufacturer data file