#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204050
Mfr serial number	STN11630-04050

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204050

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.11487
I_LEAK350V (microA)	0.17723
Substr Origin	114
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.35
R Bias Lower (MOhm)	1.12

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	34.5
20	50.26
30	57.84
40	63.67
50	68.69
60	74.09
70	79.7
80	84.96
90	89.83
100	94.44
110	98.83
120	103.08
130	107.1
140	110.99
150	114.87
160	118.57
170	122.19
180	125.77
190	129.22
200	132.64
210	136.01
220	139.29
230	142.51
240	145.44
250	148.78
260	151.81
270	154.81
280	157.81
290	160.66
300	163.53
310	166.4
320	169.18
330	171.85
340	174.55
350	177.23
	
#CV	
10	
15	O.L.
20	O.L.
25	2522.05
30	2179.87
35	1939.64
40	1760.04
45	1623.41
50	1524.47
55	1465.63
60	1439.08
65	1428.58
70	1423.78
75	1421.05
80	1419.09
85	1417.55
90	1416.27
95	1415.19
100	1414.2
105	1413.3
110	1412.5
115	1411.91
120	1411.25

#End of manufacturer data file