#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204100
Mfr serial number	STN11632-04100

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	28/11/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204100

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.10534
I_LEAK350V (microA)	0.16428
Substr Origin	115
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.34

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	483																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	36.51
20	50.54
30	57.05
40	62.07
50	66.23
60	70.43
70	74.89
80	79.24
90	83.47
100	87.59
110	91.47
120	95.22
130	98.69
140	102.04
150	105.34
160	108.48
170	111.52
180	114.58
190	117.46
200	120.3
210	123.16
220	125.88
230	128.54
240	131.17
250	133.85
260	136.42
270	138.96
280	141.55
290	144.1
300	146.63
310	149.27
320	151.99
330	154.98
340	158.86
350	164.28
	
#CV	
10	
15	O.L.
20	O.L.
25	2511.69
30	2171.15
35	1932.4
40	1753.76
45	1620.01
50	1524.1
55	1468.3
60	1443.86
65	1434.19
70	1429.72
75	1426.98
80	1424.89
85	1423.36
90	1422
95	1420.77
100	1419.81
105	1418.83
110	1417.93
115	1417.17
120	1416.39

#End of manufacturer data file