#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204103
Mfr serial number	STN11632-04103

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	31/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204103

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.16678
I_LEAK350V (microA)	0.2686
Substr Origin	115
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.34

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	49.09
20	71.3
30	82.43
40	90.8
50	98.76
60	107.38
70	115.3
80	122.6
90	129.64
100	136.31
110	142.72
120	148.96
130	155.02
140	160.96
150	166.78
160	172.53
170	178.18
180	183.7
190	189.1
200	194.5
210	199.9
220	205.3
230	210.7
240	216.1
250	221.6
260	227
270	232.3
280	237.6
290	242.6
300	247.5
310	251.4
320	255.9
330	260.2
340	264.5
350	268.6
	
#CV	
10	
15	O.L.
20	O.L.
25	2497.95
30	2153.92
35	1912.47
40	1731.51
45	1595.88
50	1501.35
55	1449.47
60	1427.96
65	1419.56
70	1415.57
75	1413.07
80	1411.28
85	1409.88
90	1408.7
95	1407.74
100	1406.89
105	1406.2
110	1405.63
115	1405.08
120	1404.65

#End of manufacturer data file