#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204104
Mfr serial number	STN11632-04104

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	31/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204104

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.17193
I_LEAK350V (microA)	0.276
Substr Origin	115
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	60
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.34

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	50.23
20	73.18
30	84.58
40	93.11
50	101.23
60	110.03
70	118.11
80	125.69
90	132.89
100	139.79
110	146.5
120	153.06
130	159.23
140	165.73
150	171.93
160	178.07
170	183.9
180	189.9
190	195.8
200	201.7
210	207.7
220	213.6
230	219.7
240	225.7
250	231.6
260	236.9
270	242.2
280	247.3
290	252.4
300	256.5
310	260.5
320	264.6
330	268.6
340	272.4
350	276
	
#CV	
10	
15	O.L.
20	O.L.
25	2495.5
30	2151.58
35	1909.86
40	1729.21
45	1593.86
50	1499.75
55	1447.9
60	1426.37
65	1418.14
70	1414.22
75	1411.83
80	1410.08
85	1408.76
90	1407.59
95	1406.67
100	1405.85
105	1405.1
110	1404.43
115	1404.07
120	1403.47

#End of manufacturer data file