#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204105
Mfr serial number	STN11632-04105

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	31/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204105

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.16454
I_LEAK350V (microA)	0.2659
Substr Origin	115
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	60
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.34

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	49.06
20	71.42
30	82.36
40	90.55
50	98.42
60	106.15
70	113.93
80	121.14
90	127.98
100	134.52
110	140.83
120	146.97
130	152.96
140	158.8
150	164.54
160	170.24
170	175.9
180	181.4
190	186.9
200	192.4
210	197.9
220	203.4
230	208.9
240	214.6
250	220
260	225.4
270	230.9
280	235.7
290	240.3
300	244.5
310	249.2
320	253.8
330	257.7
340	262.2
350	265.9
	
#CV	
10	
15	O.L.
20	O.L.
25	2485.17
30	2144.08
35	1904.7
40	1725.7
45	1591.33
50	1498.05
55	1447.41
60	1426.97
65	1419.29
70	1415.44
75	1413.07
80	1411.27
85	1409.84
90	1408.73
95	1407.72
100	1406.87
105	1406.07
110	1405.46
115	1404.97
120	1404.46

#End of manufacturer data file