#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204106
Mfr serial number	STN11632-04106

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	31/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204106

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.16125
I_LEAK350V (microA)	0.2586
Substr Origin	115
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.34

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	48.19
20	69.81
30	80.63
40	88.73
50	95.92
60	104.14
70	111.85
80	118.95
90	125.67
100	132.08
110	138.21
120	144.2
130	150.01
140	155.66
150	161.25
160	166.43
170	172.1
180	177.4
190	182.5
200	187.7
210	192.8
220	197.9
230	203
240	208.1
250	213.2
260	218.2
270	223.2
280	228
290	233.1
300	237.3
310	241.1
320	245.8
330	250.2
340	254.5
350	258.6
	
#CV	
10	
15	O.L.
20	O.L.
25	2498.61
30	2155.28
35	1914.72
40	1734.25
45	1598.14
50	1502.48
55	1449.26
60	1427.15
65	1418.66
70	1414.55
75	1412.04
80	1410.18
85	1408.73
90	1407.5
95	1406.52
100	1405.63
105	1404.87
110	1404.27
115	1403.65
120	1403.15

#End of manufacturer data file