#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204109
Mfr serial number	STN11632-04109

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	31/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204109

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.15787
I_LEAK350V (microA)	0.2511
Substr Origin	115
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	60
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.34

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	269																																							
Pinhole	369																																							
Pinhole	370																																							
Pinhole	376																																							
Pinhole	377																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section	
%RAWDATA	
DATA	
#IV	
10	47.65
20	68.76
30	79.34
40	87.27
50	94.67
60	102.28
70	109.72
80	116.64
90	123.16
100	129.38
110	135.39
120	141.21
130	146.88
140	152.43
150	157.87
160	162.96
170	168.54
180	173.76
190	178.96
200	184
210	189
220	194
230	199
240	204
250	208.9
260	213.8
270	218.8
280	223.4
290	228.1
300	232.3
310	236.4
320	240.1
330	243.8
340	247.4
350	251.1
	
#CV	
10	
15	O.L.
20	O.L.
25	2482.14
30	2141.8
35	1902.61
40	1724.12
45	1590.42
50	1498.21
55	1448.99
60	1429.05
65	1421.32
70	1417.51
75	1415.13
80	1413.38
85	1412
90	1410.81
95	1409.79
100	1408.92
105	1408.18
110	1407.54
115	1407.23
120	1406.42

#End of manufacturer data file