#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204111
Mfr serial number	STN11632-04111

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	31/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204111

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.15209
I_LEAK350V (microA)	0.2478
Substr Origin	115
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	60
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.34

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	46.23
20	66.34
30	76.38
40	83.93
50	90.96
60	98.61
70	105.77
80	112.45
90	118.78
100	124.77
110	130.57
120	136.14
130	141.59
140	146.87
150	152.09
160	157.24
170	161.98
180	167.25
190	172.15
200	177.06
210	181.8
220	186.5
230	191.3
240	196.1
250	200.8
260	205.7
270	210.6
280	215.5
290	220.1
300	224.8
310	229.4
320	234
330	238.5
340	243.3
350	247.8
	
#CV	
10	
15	O.L.
20	O.L.
25	2492.09
30	2149.99
35	1909.6
40	1730.25
45	1595.67
50	1502.12
55	1450.97
60	1429.95
65	1421.86
70	1417.9
75	1415.45
80	1413.68
85	1412.27
90	1411.13
95	1410.15
100	1409.27
105	1408.57
110	1407.97
115	1407.38
120	1406.78

#End of manufacturer data file