#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204112
Mfr serial number	STN11632-04112

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	31/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204112

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.15379
I_LEAK350V (microA)	0.2483
Substr Origin	115
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.34

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	45.26
20	65.26
30	75.53
40	83.27
50	90.52
60	98.39
70	105.7
80	112.6
90	119.07
100	125.31
110	131.25
120	137.11
130	142.77
140	148.31
150	153.79
160	159.13
170	164.45
180	169.67
190	174.84
200	180
210	184.9
220	189.9
230	195
240	199.6
250	205.1
260	210
270	215.1
280	219.8
290	224.7
300	229.3
310	234.1
320	238.4
330	241.8
340	245.2
350	248.3
	
#CV	
10	
15	O.L.
20	O.L.
25	2504.8
30	2161.02
35	1919.74
40	1739.34
45	1603.7
50	1507.83
55	1453.36
60	1430.18
65	1421.12
70	1416.86
75	1414.39
80	1412.55
85	1411.13
90	1409.96
95	1408.96
100	1408.07
105	1407.35
110	1406.65
115	1406.14
120	1405.57

#End of manufacturer data file