#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204113
Mfr serial number	STN11632-04113

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	31/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204113

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.17835
I_LEAK350V (microA)	0.2918
Substr Origin	115
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	60
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.34

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	195																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	50.54
20	73.84
30	85.56
40	94.71
50	103.36
60	112.15
70	121.01
80	129.17
90	136.93
100	144.36
110	151.5
120	158.52
130	165.35
140	172.04
150	178.35
160	185.1
170	191.6
180	198.1
190	204.6
200	211.2
210	217.9
220	224.5
230	231.5
240	238.3
250	244.9
260	250.8
270	255.8
280	261.2
290	266.7
300	271.8
310	276.7
320	281.3
330	285.3
340	288.7
350	291.8
	
#CV	
10	
15	O.L.
20	O.L.
25	2498.36
30	2155.16
35	1913.74
40	1734.61
45	1599.44
50	1504.68
55	1451.32
60	1428.91
65	1420.39
70	1416.29
75	1413.83
80	1412.02
85	1410.6
90	1409.45
95	1408.51
100	1407.68
105	1407
110	1406.44
115	1405.96
120	1405.53

#End of manufacturer data file