#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204114
Mfr serial number	STN11632-04114

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	31/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204114

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.18064
I_LEAK350V (microA)	0.2922
Substr Origin	115
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	60
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.34

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	51.03
20	74.76
30	86.72
40	95.7
50	105.5
60	114.45
70	123
80	131.01
90	138.72
100	146.15
110	153.25
120	160.26
130	167.17
140	173.95
150	180.64
160	187.2
170	193.8
180	200.5
190	207.2
200	214.1
210	221
220	227.9
230	234.8
240	240.7
250	246.4
260	251.9
270	257.3
280	263.3
290	268.8
300	273.9
310	278.8
320	283.2
330	286.4
340	289.8
350	292.2
	
#CV	
10	
15	O.L.
20	O.L.
25	2503.44
30	2159.6
35	1916.77
40	1735.62
45	1600.32
50	1506.14
55	1454.1
60	1432.36
65	1423.91
70	1419.94
75	1417.54
80	1415.78
85	1414.46
90	1413.41
95	1412.39
100	1411.63
105	1411
110	1410.57
115	1409.97
120	1409.32

#End of manufacturer data file