#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204116
Mfr serial number	STN11632-04116

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	31/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204116

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.16619
I_LEAK350V (microA)	0.2747
Substr Origin	115
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.34

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	455																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	48.58
20	70.45
30	104.58
40	90.09
50	97.62
60	105.91
70	113.8
80	121.21
90	128.26
100	135.02
110	141.54
120	147.91
130	154.12
140	160.18
150	166.19
160	172.12
170	177.99
180	183.7
190	189.4
200	195.1
210	200.9
220	206.6
230	212.3
240	218.1
250	223.9
260	229.7
270	235.5
280	241.3
290	246.7
300	251.8
310	256.4
320	261.2
330	265.8
340	270.2
350	274.7
	
#CV	
10	
15	O.L.
20	O.L.
25	2499.81
30	2157.43
35	1916.57
40	1737.03
45	1601.35
50	1505.21
55	1450.7
60	1427.73
65	1418.9
70	1414.71
75	1412.2
80	1410.53
85	1409.1
90	1407.9
95	1406.91
100	1405.99
105	1405.17
110	1404.56
115	1404.04
120	1403.59

#End of manufacturer data file