#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204117
Mfr serial number	STN11632-04117

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	31/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204117

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.16684
I_LEAK350V (microA)	0.2743
Substr Origin	115
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.34

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	517																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	48.46
20	69.98
30	81.09
40	89.48
50	97.36
60	105.88
70	113.78
80	121.24
90	128.39
100	135.12
110	141.86
120	148.34
130	154.64
140	160.79
150	166.84
160	172.86
170	178.77
180	184.5
190	190.1
200	195.7
210	201.4
220	207.1
230	212.7
240	218.4
250	224.2
260	229.7
270	235.4
280	241
290	246.3
300	251.3
310	256.1
320	260.9
330	265.4
340	269.9
350	274.3
	
#CV	
10	
15	O.L.
20	O.L.
25	2523.98
30	2177.51
35	1934.31
40	1752.32
45	1614.29
50	1514.17
55	1454.97
60	1428.87
65	1418.86
70	1414.31
75	1411.65
80	1409.79
85	1408.3
90	1407.07
95	1406.08
100	1405.24
105	1404.44
110	1403.84
115	1403.24
120	1402.74

#End of manufacturer data file