#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204118
Mfr serial number	STN11632-04118

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	31/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204118

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.1702
I_LEAK350V (microA)	0.2736
Substr Origin	115
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.34

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	49.06
20	71.68
30	83.01
40	91.52
50	100.1
60	108.61
70	116.63
80	124.17
90	131.42
100	138.29
110	144.98
120	151.47
130	157.83
140	164.06
150	170.2
160	176.33
170	182.3
180	188.3
190	194.2
200	200.3
210	206.3
220	212.5
230	218.7
240	225.3
250	231.3
260	236.8
270	241.8
280	246.3
290	250.4
300	255.3
310	260.1
320	264.4
330	268.1
340	271.1
350	273.6
	
#CV	
10	
15	O.L.
20	O.L.
25	2525.83
30	2177.75
35	1932.35
40	1749.28
45	1611.35
50	1511.86
55	1453.87
60	1428.73
65	1419.01
70	1414.56
75	1411.96
80	1410.12
85	1408.79
90	1407.66
95	1406.73
100	1406.01
105	1405.32
110	1404.84
115	1404.36
120	1403.56

#End of manufacturer data file