#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204119
Mfr serial number	STN11632-04119

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	31/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204119

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.17324
I_LEAK350V (microA)	0.282
Substr Origin	115
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.34

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	119																																							
Pinhole	163																																							
Pinhole	481																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA	
DATA	
#IV	
10	49.7
20	72.2
30	83.63
40	92.29
50	101.08
60	109.5
70	117.74
80	125.5
90	132.96
100	140.13
110	147.05
120	153.82
130	160.42
140	166.88
150	173.24
160	179.61
170	185.8
180	192
190	198.3
200	204.5
210	210.7
220	216.7
230	222.8
240	228.7
250	234.4
260	240.3
270	246
280	251.3
290	256.2
300	261
310	264.9
320	269.4
330	273.2
340	277.9
350	282
	
#CV	
10	
15	O.L.
20	O.L.
25	2517.89
30	2172.31
35	1929.59
40	1747.6
45	1609.99
50	1510.49
55	1452.01
60	1426.45
65	1416.45
70	1411.89
75	1409.26
80	1407.36
85	1405.93
90	1404.73
95	1403.77
100	1402.91
105	1402.21
110	1401.59
115	1400.95
120	1400.51

#End of manufacturer data file