#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204120
Mfr serial number	STN11632-04120

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	31/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204120

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.16044
I_LEAK350V (microA)	0.2588
Substr Origin	115
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	60
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.34

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	563																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	47.15
20	67.87
30	78.56
40	86.74
50	94.35
60	102.3
70	110.12
80	117.39
90	124.24
100	130.77
110	136.82
120	143.1
130	148.99
140	154.75
150	160.44
160	166.01
170	171.52
180	176.94
190	182.1
200	187.3
210	192.5
220	197.6
230	202.6
240	207.7
250	212.6
260	217.6
270	222.6
280	227.5
290	232.1
300	237.2
310	241.7
320	246.1
330	250.3
340	254.5
350	258.8
	
#CV	
10	
15	O.L.
20	O.L.
25	2520.28
30	2173.61
35	1930.71
40	1748.65
45	1610.73
50	1510.84
55	1452.14
60	1426.52
65	1416.55
70	1411.93
75	1409.22
80	1407.34
85	1405.83
90	1404.58
95	1403.53
100	1402.67
105	1401.9
110	1401.17
115	1400.62
120	1400.05

#End of manufacturer data file