#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204121
Mfr serial number	STN11632-04121

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	31/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204121

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.17469
I_LEAK350V (microA)	0.287
Substr Origin	115
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	60
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.34

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	50.12
20	72.65
30	84.2
40	92.94
50	101.29
60	110.27
70	118.59
80	126.47
90	134.01
100	141.26
110	148.22
120	155.06
130	161.71
140	168.22
150	174.69
160	181
170	187.4
180	193.2
190	199.9
200	206.2
210	212.5
220	218.4
230	224.7
240	231
250	237.1
260	243.2
270	249.1
280	254.3
290	259.6
300	263.8
310	269
320	273.8
330	278.4
340	282.7
350	287
	
#CV	
10	
15	O.L.
20	O.L.
25	2508.91
30	2164.49
35	1922.81
40	1742.06
45	1605.51
50	1507.35
55	1449.78
60	1424.01
65	1413.68
70	1408.91
75	1406.17
80	1404.25
85	1402.77
90	1401.55
95	1400.55
100	1399.7
105	1398.97
110	1398.34
115	1397.86
120	1397.4

#End of manufacturer data file