#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204122
Mfr serial number	STN11632-04122

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	31/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204122

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.17164
I_LEAK350V (microA)	0.2807
Substr Origin	115
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	60
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.34

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	49.02
20	71.06
30	82.35
40	90.91
50	99.39
60	108.25
70	116.43
80	124.18
90	131.61
100	138.73
110	145.59
120	152.3
130	158.59
140	165.28
150	171.64
160	177.96
170	184.1
180	190.2
190	196.2
200	202.3
210	208.3
220	214.3
230	220.2
240	226.1
250	232
260	237.8
270	242.7
280	248.6
290	253.8
300	258.9
310	263.6
320	267.8
330	272.4
340	276.6
350	280.7
	
#CV	
10	
15	O.L.
20	O.L.
25	2527.79
30	2179.58
35	1934.63
40	1751.56
45	1613.25
50	1512.95
55	1453.02
60	1426.29
65	1415.9
70	1411.22
75	1408.54
80	1406.64
85	1405.17
90	1404.01
95	1403
100	1402.18
105	1401.45
110	1400.75
115	1400.29
120	1399.8

#End of manufacturer data file