#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204123
Mfr serial number	STN11632-04123

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	31/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204123

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.16112
I_LEAK350V (microA)	0.263
Substr Origin	115
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.34

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	120																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	47.15
20	67.8
30	78.8
40	86.69
50	94.37
60	102.52
70	110.24
80	117.44
90	124.4
100	130.97
110	137.36
120	143.57
130	149.53
140	155.44
150	161.12
160	166.82
170	172.33
180	177.83
190	183.1
200	188.4
210	193.2
220	198.8
230	204.1
240	209.2
250	214.5
260	219.7
270	225.1
280	230.5
290	235.7
300	240.9
310	245.8
320	250.1
330	254.4
340	258.8
350	263
	
#CV	
10	
15	O.L.
20	O.L.
25	2525.29
30	2178.58
35	1934.48
40	1752.41
45	1614.54
50	1514.54
55	1455.13
60	1429.07
65	1419.08
70	1414.5
75	1411.87
80	1410.02
85	1408.6
90	1407.48
95	1406.48
100	1405.66
105	1405
110	1404.4
115	1404
120	1403.5

#End of manufacturer data file