#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204124
Mfr serial number	STN11632-04124

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	31/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204124

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.16194
I_LEAK350V (microA)	0.2641
Substr Origin	115
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	60
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.34

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	346																																							
Pinhole	353																																							
Pinhole	358																																							
Pinhole	362																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section	
%RAWDATA	
DATA	
#IV	
10	47.41
20	68.32
30	79.11
40	87.5
50	95.13
60	103.22
70	110.81
80	118.06
90	125.12
100	131.76
110	138.08
120	144.36
130	150.26
140	156.16
150	161.94
160	167.46
170	173.42
180	178.8
190	184.3
200	189.7
210	195.1
220	200.4
230	205.8
240	211
250	216.5
260	221.7
270	227.3
280	232.5
290	237.9
300	242.8
310	248
320	251.9
330	256.2
340	260.7
350	264.1
	
#CV	
10	
15	O.L.
20	O.L.
25	2509.88
30	2165.01
35	1922.08
40	1741.25
45	1604.58
50	1506.56
55	1450
60	1425.58
65	1416.14
70	1411.78
75	1409.2
80	1407.36
85	1405.95
90	1404.76
95	1403.75
100	1402.91
105	1402.21
110	1401.62
115	1401.02
120	1400.62

#End of manufacturer data file