#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204125
Mfr serial number	STN11632-04125

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	31/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204125

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.15968
I_LEAK350V (microA)	0.2602
Substr Origin	115
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.34

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	46.95
20	67.53
30	78.11
40	86.15
50	94.11
60	102.17
70	109.67
80	116.78
90	123.57
100	130.06
110	136.3
120	142.37
130	148.27
140	154.02
150	159.68
160	164.94
170	170.75
180	176.17
190	181.4
200	186.7
210	192
220	197.2
230	202.5
240	207.8
250	213.2
260	218.7
270	224.1
280	229.4
290	234.1
300	238.7
310	243.3
320	247.9
330	252.2
340	256.4
350	260.2
	
#CV	
10	
15	O.L.
20	O.L.
25	2510.67
30	2165.9
35	1922.13
40	1741.5
45	1605.1
50	1507.75
55	1451.71
60	1427.25
65	1417.67
70	1413.34
75	1410.78
80	1408.97
85	1407.64
90	1406.44
95	1405.5
100	1404.71
105	1404.06
110	1403.49
115	1402.93
120	1402.47

#End of manufacturer data file