#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204129
Mfr serial number	STN11632-04129

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	31/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204129

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.16943
I_LEAK350V (microA)	0.2742
Substr Origin	115
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.34

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	50.37
20	73.49
30	84.9
40	93.43
50	101.25
60	109.86
70	117.81
80	125.22
90	132.21
100	138.9
110	145.34
120	151.6
130	157.69
140	163.6
150	169.43
160	175.17
170	180.82
180	186.3
190	191.8
200	197.2
210	202.6
220	208.1
230	213.5
240	219
250	224.7
260	230.3
270	235.8
280	241.3
290	246.3
300	250.7
310	255.4
320	260.6
330	265.3
340	269.8
350	274.2
	
#CV	
10	
15	O.L.
20	O.L.
25	2536.86
30	2187.63
35	1942.48
40	1757.9
45	1618.22
50	1516.39
55	1454.86
60	1426.88
65	1415.86
70	1410.98
75	1408.21
80	1406.31
85	1404.83
90	1403.66
95	1402.7
100	1401.89
105	1401.16
110	1400.53
115	1400.05
120	1399.48

#End of manufacturer data file