#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204130
Mfr serial number	STN11632-04130

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	31/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204130

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.3177
I_LEAK350V (microA)	0.5205
Substr Origin	115
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	60
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.34

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	333																																							
Pinhole	334																																							
Pinhole	363																																							
Pinhole	416																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section	
%RAWDATA	
DATA	
#IV	
10	83.85
20	123.27
30	147.61
40	166.98
50	184.9
60	201.6
70	217.2
80	231
90	245.7
100	258
110	270.9
120	284.7
130	297.3
140	306.8
150	317.7
160	329.5
170	338.4
180	346.3
190	358.1
200	369.1
210	380
220	390.3
230	400.4
240	412
250	422
260	432.8
270	442.4
280	453.3
290	463.4
300	473.8
310	484.1
320	492.8
330	504.7
340	511.8
350	520.5
	
#CV	
10	
15	O.L.
20	O.L.
25	2528.31
30	2180.41
35	1935.88
40	1752.14
45	1613.16
50	1512.33
55	1452.52
60	1426.49
65	1416.51
70	1412.08
75	1409.47
80	1407.57
85	1406.06
90	1404.88
95	1403.84
100	1402.95
105	1402.12
110	1401.5
115	1400.73
120	1400.13

#End of manufacturer data file