#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204133
Mfr serial number	STN11632-04133

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	31/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204133

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.15901
I_LEAK350V (microA)	0.2606
Substr Origin	115
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	60
R Bias Upper (MOhm)	1.65
R Bias Lower (MOhm)	1.34

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	305																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	46.89
20	67.67
30	78.18
40	86.08
50	93.58
60	101.64
70	109.11
80	116.12
90	122.8
100	129.04
110	135.38
120	141.44
130	147.38
140	153.22
150	159.01
160	164.74
170	170.39
180	176.03
190	181.4
200	187
210	192.5
220	197.9
230	203.4
240	208.9
250	214.4
260	219.9
270	225.2
280	230.9
290	235.6
300	240
310	244.8
320	249
330	252.9
340	256.6
350	260.6
	
#CV	
10	
15	O.L.
20	O.L.
25	2522.57
30	2175.69
35	1931.74
40	1748.85
45	1610.83
50	1510.49
55	1451.05
60	1425.01
65	1415.05
70	1410.56
75	1407.91
80	1406.02
85	1404.6
90	1403.47
95	1402.5
100	1401.74
105	1401.09
110	1400.56
115	1399.96
120	1399.59

#End of manufacturer data file