#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204204
Mfr serial number	STN11637-04204

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	06/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204204

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.12824
I_LEAK350V (microA)	0.1926
Substr Origin	117
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	60
R Bias Upper (MOhm)	1.64
R Bias Lower (MOhm)	1.48

#Comment section	
%COMMENT	
Al remainder between 339ch. and 340ch.	


#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	43.07
20	60.62
30	69.53
40	76.16
50	81.6
60	86.81
70	92.12
80	97.34
90	102.49
100	107.35
110	111.87
120	116.18
130	120.32
140	124.35
150	128.24
160	132.04
170	135.67
180	139.14
190	142.83
200	146.31
210	149.76
220	153.12
230	156.44
240	159.71
250	162.91
260	166.05
270	169.11
280	172.01
290	175.22
300	178.24
310	181.2
320	184.1
330	186.92
340	189.9
350	192.6
	
#CV	
10	
15	O.L.
20	O.L.
25	2536.1
30	2187.97
35	1945.37
40	1763.21
45	1624.82
50	1523.91
55	1463
60	1435.4
65	1424.57
70	1419.7
75	1416.7
80	1414.7
85	1413.02
90	1411.63
95	1410.42
100	1409.41
105	1408.48
110	1407.83
115	1407.13
120	1406.32

#End of manufacturer data file