#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204205
Mfr serial number	STN11637-04205

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	06/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204205

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.12209
I_LEAK350V (microA)	0.18662
Substr Origin	117
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	293
Vdep (V)	60
R Bias Upper (MOhm)	1.64
R Bias Lower (MOhm)	1.48

#Comment section	
%COMMENT	
Al remainder between 339ch. and 340ch.	


#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	40.35
20	56.63
30	64.88
40	71.06
50	76.2
60	81.04
70	86.31
80	91.68
90	96.79
100	101.56
110	106.01
120	110.27
130	114.38
140	118.35
150	122.09
160	125.98
170	129.69
180	134.14
190	138.2
200	141.77
210	145.17
220	148.44
230	151.57
240	154.71
250	158.09
260	160.8
270	163.66
280	166.6
290	169.6
300	172.58
310	175.47
320	178.29
330	181.1
340	183.9
350	186.62
	
#CV	
10	
15	O.L.
20	O.L.
25	2506.71
30	2163.6
35	1924.7
40	1745.46
45	1609.61
50	1511.84
55	1455.21
60	1431.02
65	1421.7
70	1417.25
75	1414.5
80	1412.47
85	1410.86
90	1409.49
95	1408.3
100	1407.24
105	1406.31
110	1405.52
115	1404.71
120	1404.12

#End of manufacturer data file