#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204225
Mfr serial number	STN11637-04225

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	06/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204225

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.12971
I_LEAK350V (microA)	0.19573
Substr Origin	117
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	293
Vdep (V)	60
R Bias Upper (MOhm)	1.64
R Bias Lower (MOhm)	1.48

#Comment section	
%COMMENT	
Al remainder between 339ch. and 340ch.	


#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	43.77
20	60.88
30	69.7
40	76.31
50	81.73
60	87.02
70	92.62
80	98.22
90	103.45
100	108.38
110	113.01
120	117.4
130	121.65
140	125.74
150	129.71
160	133.56
170	137.24
180	140.8
190	144.55
200	148.13
210	151.58
220	155.04
230	158.42
240	161.74
250	165.01
260	168.28
270	171.45
280	174.49
290	177.75
300	180.9
310	183.9
320	186.89
330	189.9
340	192.8
350	195.73
	
#CV	
10	
15	O.L.
20	O.L.
25	2504.49
30	2162.12
35	1923.21
40	1744.1
45	1608.41
50	1510.85
55	1455.15
60	1431.93
65	1423.1
70	1418.64
75	1415.91
80	1413.97
85	1412.43
90	1411.18
95	1410.03
100	1409.02
105	1408.07
110	1407.06
115	1406.52
120	1405.64

#End of manufacturer data file