#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204229
Mfr serial number	STN11637-04229

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	06/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204229

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.11919
I_LEAK350V (microA)	0.17635
Substr Origin	117
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	60
R Bias Upper (MOhm)	1.64
R Bias Lower (MOhm)	1.48

#Comment section	
%COMMENT	
Al remainder between 339ch. and 340ch.	


#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	41.61
20	57.36
30	65.45
40	71.3
50	76.22
60	81.02
70	85.99
80	90.98
90	95.76
100	100.21
110	104.37
120	108.29
130	111.98
140	115.67
150	119.19
160	122.59
170	125.83
180	129.07
190	132.22
200	135.33
210	138.36
220	141.34
230	144.15
240	147.15
250	149.97
260	152.74
270	155.46
280	158.16
290	160.85
300	163.52
310	166.13
320	168.71
330	171.16
340	173.82
350	176.35
	
#CV	
10	
15	O.L.
20	O.L.
25	2517.71
30	2174.05
35	1933.91
40	1753.75
45	1617.28
50	1518.21
55	1459.67
60	1434.11
65	1424.3
70	1419.75
75	1417
80	1414.99
85	1413.45
90	1412.15
95	1410.98
100	1409.86
105	1408.86
110	1408.1
115	1407.32
120	1406.62

#End of manufacturer data file