#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204247
Mfr serial number	STN11638-04247

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	09/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204247

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.1553
I_LEAK350V (microA)	0.2438
Substr Origin	120
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	294
Vdep (V)	60
R Bias Upper (MOhm)	1.45
R Bias Lower (MOhm)	1.23

#Comment section	
%COMMENT	
Al remainder between 339ch. and 340ch.	


#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	50.71
20	71.85
30	82.24
40	89.85
50	97.04
60	103.33
70	110.36
80	116.86
90	122.99
100	128.84
110	134.43
120	139.88
130	145.19
140	150.36
150	155.3
160	160.6
170	165.5
180	170.45
190	175.35
200	180.28
210	185.1
220	189.9
230	194.7
240	199.35
250	204.4
260	209.2
270	213.7
280	218
290	222.5
300	226.4
310	230
320	234.3
330	237.8
340	240.5
350	243.8
	
#CV	
10	
15	O.L.
20	O.L.
25	2544.38
30	2195.12
35	1951.64
40	1766.58
45	1625.46
50	1520.41
55	1453.92
60	1422.53
65	1409.9
70	1403.74
75	1400.49
80	1398.46
85	1396.91
90	1395.69
95	1394.69
100	1393.73
105	1392.87
110	1392.15
115	1391.51
120	1390.91

#End of manufacturer data file