#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204256
Mfr serial number	STN11638-04256

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	09/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204256

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.14132
I_LEAK350V (microA)	0.2299
Substr Origin	119
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	65
R Bias Upper (MOhm)	1.45
R Bias Lower (MOhm)	1.23

#Comment section	
%COMMENT	
Al remainder between 339ch. and 340ch.	


#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	48.03
20	67.44
30	76.86
40	83.66
50	89.92
60	95.73
70	101.76
80	107.45
90	112.76
100	117.93
110	122.84
120	127.61
130	132.3
140	136.92
150	141.32
160	145.97
170	150.33
180	154.71
190	159
200	163.32
210	167.62
220	171.8
230	175.99
240	180.14
250	184.3
260	188.5
270	192.55
280	196.6
290	200.4
300	204.3
310	208
320	211.1
330	213.4
340	215.9
350	229.9
	
#CV	
10	
15	O.L.
20	O.L.
25	2595.09
30	2238.85
35	1990.35
40	1800.69
45	1656.36
50	1546.95
55	1473.14
60	1435.9
65	1420.99
70	1414.99
75	1411.79
80	1409.64
85	1408.13
90	1406.84
95	1405.76
100	1404.94
105	1404.14
110	1403.53
115	1403.04
120	1402.46

#End of manufacturer data file